Session Label | Session Title | Time | Location | Details |
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2.1 | Advanced Technology Nodes: Dependency on Collaboration | 11:30 - 13:00 | Oisans | Read More |
2.2 | Acceleration and Verification of ESL and Analog Systems | 11:30 - 13:00 | Belle-Etoile | Read More |
2.3 | Energy Optimization in Multi-core Systems | 11:30 - 13:00 | Stendahl | Read More |
2.4 | Memory and Cache Architectures | 11:30 - 13:00 | Chartreuse | Read More |
2.5 | Communications, Multimedia, and Consumer Electronics | 11:30 - 13:00 | Meije | Read More |
2.6 | HOT TOPIC: Reliability Challenges of Real-time Systems in Forthcoming Technology Nodes | 11:30 - 13:00 | Bayard | Read More |
2.7 | Safety Critical Real-Time Systems | 11:30 - 13:00 | Les Bans | Read More |
2.8 | HOT TOPIC: IP Subsystems: The next productivity wave? | 11:30 - 13:00 | Lesdigiueres (Exhibition Theatre) | Read More |
3.0 | Special Lunch-Time Session: Grenoble ecosystem to provide semiconductor alternative process for advanced CMOS | 13:00 - 14:00 | Auditorium Dauphine | Read More |
3.1 | The Role of Prototyping in Today's SOCs | 14:30 - 16:00 | Oisans | Read More |
3.2 | PANEL: The Heritage of Mead & Conway: What Has Remained the Same, What Was Missed, What Has Changed, What Lies Ahead | 14:30 - 16:00 | Belle-Etoile | Read More |
3.3 | Addressing Process and Delay Variation in High-Level Synthesis | 14:30 - 16:00 | Stendahl | Read More |
3.4 | Microarchitectural Techniques for Reliability | 14:30 - 16:00 | Chartreuse | Read More |
3.5 | Energy Efficient Mobile and Cloud Computing Systems | 14:30 - 16:00 | Meije | Read More |
3.6 | Dealing with Timing Variation in Advanced Technologies | 14:30 - 16:00 | Bayard | Read More |
3.7 | Timing Analysis | 14:30 - 16:00 | Les Bans | Read More |
3.8 | HOT TOPIC: Design for Variability, Manufacturability, Reliability, and Debug: Many Faces of the Same Coin? | 14:30 - 16:00 | Lesdigiueres (Exhibition Theatre) | Read More |
IP1 | Interactive Presentations | 16:00 - 16:30 | Exhibition Hall (espace accueil) | Read More |
4.1 | Is reusing off-the-shelf Semiconductor IP possible today? | 17:00 - 18:30 | Oisans | Read More |
4.2 | The Quest for Better NoCs | 17:00 - 18:30 | Belle-Etoile | Read More |
4.3 | EMBEDDED TUTORIAL: Reliability Analysis Reloaded: How Will We Survive? | 17:00 - 18:30 | Stendahl | Read More |
4.4 | Emerging Solutions to Manage Energy/Performance Trad-Offs Along the Memory Hierarchy | 17:00 - 18:30 | Chartreuse | Read More |
4.5 | Device Identification and Protection | 17:00 - 18:30 | Meije | Read More |
4.6 | New Techniques for Test Pattern Generation | 17:00 - 18:30 | Bayard | Read More |
4.7 | HOT TOPIC: Security Challenges in Automotive Hardware/Software Architecture Design | 17:00 - 18:30 | Les Bans | Read More |
4.8 | EXHIBITION THEATRE: Testimonials | 17:00 - 18:30 | Lesdigiueres (Exhibition Theatre) | Read More |