Date: Tuesday 19 March 2013
Time: 11:30 - 13:00
Location / Room: Bayard

Organisers:
Said Hamdioui, Delft University of Technology, NL
Dimitris Gizopoulos, University of Athens, GR

Chair:
Said Hamdioui, Delft University of Technology, NL

Co-Chair:
Dimitris Gizopoulos, University of Athens, GR

Three leading researchers in various layers of system design and integration (technology, circuit, system, application) will present recent innovations in addressing emerging questions about reliability of the electronics of today's and tomorrow's real-time systems. Speakers will address the challenges from technology perspective, from circuit/IP perspective and from architectural and hardware/software integration perspective.

Time	Label	Presentation Title Authors
11:30	2.6.1	CHALLENGES IN ASSESSING AND ASSURING RELIABILITY OF NANO-SCALED CMOS TECHNOLOGIES Author: Guido Groeseneken, IMEC, BE Abstract
12:00	2.6.2	ADDA: ADAPTIVE DOUBLE-SAMPLING ARCHITECTURE FOR HIGHLY FLEXIBLE ROBUST DESIGN Author: Michael Nicolaidis, TIMA, FR Abstract
12:30	2.6.3	RELIABILITY CHALLENGES IN THE DESIGN OF CRITICAL EMBEDDED SYSTEMS Authors: Arnaud Grasset and Philippe Bonnot, Thales, FR Abstract
13:00		End of session Lunch Break in Auditorium Dauphine (Lunch and Learn Session) and Ecrins Sandwich lunch in both locations (Lunch and Learn Session Sponsored by Mentor Graphics: "Grenoble Ecosystem to Provide Semiconductor Alternative Process for Advanced CMOS - 1300-1400 hrs; http://www.date-conference.com/conference/session/3.0)