Date: Tuesday 19 March 2013
Time: 14:30 - 16:00
Location / Room: Bayard

Chair:
Bram Kruseman, NXP, NL

Co-Chair:
Saqib Khursheed, University of Southampton, UK

To get the best performance one needs to minimize slack, however, this is getting challenging since one needs to take into account many aspects. The papers in this session present the benefits of taking aging into account during the design phase, how to measure in-situ the slack, and test pattern generation that takes into account statistical variation to improve coverage.

Time	Label	Presentation Title Authors
14:30	3.6.1	(Best Paper Award Candidate) MTTF-BALANCED PIPELINE DESIGN Authors: Fabian Oboril and Mehdi Tahoori, Karlsruhe Institute of Technology, DE Abstract
15:00	3.6.2	EFFICIENT VARIATION-AWARE STATISTICAL DYNAMIC TIMING ANALYSIS FOR DELAY TEST APPLICATIONS Authors: Marcus Wagner and Hans-Joachim Wunderlich, University of Stuttgart, DE Abstract
15:30	3.6.3	SLACKPROBE: A LOW OVERHEAD IN SITU ON-LINE TIMING SLACK MONITORING METHODOLOGY Authors: Liangzhen Lai1, Vikas Chandra2, Rob Aitken2 and Puneet Gupta1 1University of California, Los Angeles, US; 2ARM, US Abstract
16:00	IP1-18, 224	CAPTURING POST-SILICON VARIATIONS BY LAYOUT-AWARE PATH-DELAY TESTING Authors: Xiaolin Zhang, Jing Ye, Yu Hu and Xiaowei Li, Chinese Academy of Sciences, CN Abstract
16:01	IP1-19, 678	ADAPTIVE REDUCTION OF THE FREQUENCY SEARCH SPACE FOR MULTI-VDD DIGITAL CIRCUITS Authors: Chandra Suresh1, Ender Yilmaz2, Ozgur Sinanoglu1 and Sule Ozev3 1NYU Abu Dhabi, AE; 2Freescale, US; 3Arizona State University, US Abstract
16:00		End of session Coffee Break in Exhibition Hall Monday and Friday morning and afternoon coffee breaks will be located in the Salle de Reception. On Tuesday-Thursday the breaks will be located in the Exhibition Hall. Morning and afternoon (with the exception of Thursday afternoon which is a 30 minute break) coffee breaks on Tuesday-Thursday are extended breaks and will run for 60 minutes (coffee points will be open for the first 30 minutes only) from the start time indicated in the programme.