Ten pre-conference tutorials will be given on Monday. All tutorials are half-day tutorials, five to be given in the morning and five in the afternoon. A participant should enroll for one morning and/or one afternoon half-day tutorial (it is possible to attend for a morning or afternoon only).
The titles, organisers, speakers, and abstracts of the tutorials are given below:
All tutorials run in parallel in accordance with the timetable below.
Rooms will be signposted.
08:00-09:30 | Registration and Tutorial Welcome Refreshments in "Salle de Reception" in front of the Tutorial rooms |
09:30-11:00 | Tutorials |
11:00-11:30 | Break |
11:30-13:00 | Tutorials |
13:00-14:30 | Lunch |
13:30 | CONFERENCE REGISTRATION BEGINS |
14:30-16:00 | Tutorials |
16:00-16:30 | Break |
16:30-18:00 | Tutorials |
18:00-19:30 | WELCOME RECEPTION |
19:00-21:00 | FRINGE TECHNICAL MEETINGS |
For further information please contact:
Tutorials Chair
Session ID | Title | Time | Location / Room | Details |
---|---|---|---|---|
M01 | New Technologies: Spintronics: From Devices To Systems | 09:30-13:00 | Belle Etoile | Read More |
M02 | New Technologies: Spin Orbit Torque Magnetic Memories (SOT-MRAM): A Device to Architecture Review | 14:30-18:00 | Belle Etoile | Read More |
M03 | Embedded Systems: Embedded Memory Design for Future Technologies: Challenges, Solutions and Applications | 09:30-13:00 | Meije | Read More |
M04 | Embedded Systems: Functional Qualification: Applications in the C/C++ domain | 14:30-18:00 | Meije | Read More |
M05 | Automotive: Let's kick start electric vehicles! | 09:30-13:00 | Chartreuse | Read More |
M06 | Automotive: Automotive Cyber-Physical Systems | 14:30-18:00 | Chartreuse | Read More |
M07 | Low Power: Fixed-point refinement, a guaranteed approach towards energy efficient computing | 09:30-13:00 | Sept Laux | Read More |
M08 | Low Power: The power of Power in future wireless smart systems for the Internet of Things | 14:30-18:00 | Sept Laux | Read More |
M09 | Testing: From Data to Actions: Applications of Data Analytics in Semiconductor Manufacturing & Test | 09:30-13:00 | Les Bans | Read More |
M10 | Testing: Memory Test and Reliability in Nano-Era | 14:30-18:00 | Les Bans | Read More |