M09 Testing: From Data to Actions: Applications of Data Analytics in Semiconductor Manufacturing & Test

Agenda

Time	Label	Session
09:30	M09.1	Introduction
09:30	M09.1.1	Data analytics opportunities in semiconductor manufacturing and test Yiorgos Makris, The University of Texas at Dallas, US
09:45	M09.2	Wafer-level variation analysis and applications
09:45	M09.2.1	Fundamentals of spatial and spatiotemporal variation modeling Yiorgos Makris, The University of Texas at Dallas, US
10:15	M09.2.2	Test cost reduction through statistical estimation using inter-die correlations Yiorgos Makris, The University of Texas at Dallas, US
10:45	M09.2.3	Process monitoring, outlier detection, and yield learning Yiorgos Makris, The University of Texas at Dallas, US
11:30	M09.3	Statistical learning in test
11:30	M09.3.1	Fundamentals of machine learning and its applications in test Haralampos-G. Stratigopoulos, TIMA Laboratory, FR
12:00	M09.3.2	Adaptive test Haralampos-G. Stratigopoulos, TIMA Laboratory, FR
12:30	M09.3.3	Probabilistic test metrics for evaluating alternative low-cost tests Haralampos-G. Stratigopoulos, TIMA Laboratory, FR