Date: Tuesday 26 March 2019
Time: 17:00 - 18:30
Location / Room: Room 1

Chair:
Subhasish Mitra, Stanford, US

This session titled "The Future of Test" explores various aspects of test: from traditional manufacturing test, to its role in addressing yield and reliability at advanced technology nodes, all the way to the design and test of quantum computers. The role of testing beyond manufacturing (e.g., in system validation and security) will also be explored.

Time	Label	Presentation Title Authors
17:00	4.1.1	YIELD AND RELIABILITY CHALLENGES AND SOLUTIONS AT 7NM AND BELOW Speaker and Author: Andrzej Strojwas, Carnegie Mellon University and PDF Solutions, US
17:30	4.1.2	THREE POSSIBLE ALTERNATE REALITIES FOR THE FUTURE OF TEST Speaker and Author: Jeff Rearick, AMD, US
18:00	4.1.3	WHAT ABOUT THE DESIGN AND TEST OF QUANTUM COMPUTERS? Speaker and Author: Leon Stok, IBM, US
18:30		End of session Exhibition Reception in Exhibition Area The Exhibition Reception will take place on Tuesday in the exhibition area, where free drinks for all conference delegates and exhibition visitors will be offered. All exhibitors are welcome to also provide drinks and snacks for the attendees.