Constructive Use of Process Variations: Reconfigurable and High-Resolution Delay-Line
Wenhao Wang1,a, Yukui Luo1,b and Xiaolin Xu1,e
Northeastern University
awang.wenh@northeastern.edu
bluo.yuk@northeastern.edu
cx.xu@northeastern.edu
ABSTRACT
Delay-line is a critical circuit component for highspeed electronic design and testing, such as high-performance FPGA and ASICs, to provide timing signals of specific duration or duty cycle. However, the performance of existing CMOS-based delay-lines is limited by various practical issues. For example, the minimum propagation delay (resolution) of CMOS gates is limited by the process variations from circuit fabrication. This paper presents a novel delay-line scheme, which instead of mitigating the process variations from circuit fabrication, constructively leverages them to generate time signals of specific duration. Moreover, the resolution of the proposed delay-line method is reconfigurable, for which we propose a Machine Learning modeling method to assist such reconfiguration, i.e., to generate time duration of different scales. The performance of the proposed delay-line is validated with HSpice simulation and prototype on a Xilinx Virtex-6 FPGA evaluation kit. The experimental results demonstrate that the proposed delay-line method achieves an ultra-high resolution of sub-picosecond.
Keywords: Delay-Line, Sub-Picosecond, Machine Learning.
