Agenda
| Time | Label | Session |
|---|---|---|
| 09:30 | M09.1 | Introduction |
| 09:30 | M09.1.1 | Data analytics opportunities in semiconductor manufacturing and test Yiorgos Makris, The University of Texas at Dallas, US |
| 09:45 | M09.2 | Wafer-level variation analysis and applications |
| 09:45 | M09.2.1 | Fundamentals of spatial and spatiotemporal variation modeling Yiorgos Makris, The University of Texas at Dallas, US |
| 10:15 | M09.2.2 | Test cost reduction through statistical estimation using inter-die correlations Yiorgos Makris, The University of Texas at Dallas, US |
| 10:45 | M09.2.3 | Process monitoring, outlier detection, and yield learning Yiorgos Makris, The University of Texas at Dallas, US |
| 11:30 | M09.3 | Statistical learning in test |
| 11:30 | M09.3.1 | Fundamentals of machine learning and its applications in test Haralampos-G. Stratigopoulos, TIMA Laboratory, FR |
| 12:00 | M09.3.2 | Adaptive test Haralampos-G. Stratigopoulos, TIMA Laboratory, FR |
| 12:30 | M09.3.3 | Probabilistic test metrics for evaluating alternative low-cost tests Haralampos-G. Stratigopoulos, TIMA Laboratory, FR |