W2 1st RIIF Workshop - Towards Standards for Specifying and Modeling the Reliability of Complex Electronic Systems

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Agenda

Agenda

TimeLabelSession
08:30W2.1Session 1 : Opening
08:30W2.1.1Introduction to the RIIF Initiative
Adrian Evans, iROC Technologies, FR

08:50W2.2Session 2 : Processor Reliability
08:50W2.2.1Improving Server Reliability - A Front-End Design Engineering Perspective
Burcin Aktan, Intel, US

09:25W2.2.2Reliability Availability Serviceability (RAS) of IBM POWER & Mainframe (z) Servers
Michael Müller, IBM, DE

10:00W2.2.3Reliability Modeling Challenges - An IP Provider's Perspective
Peter Harrod, ARM, UK

10:30W2Coffee Break

Monday and Friday morning and afternoon coffee breaks will be located in the Salle de Reception. On Tuesday-Thursday the breaks will be located in the Exhibition Hall. Morning and afternoon (with the exception of Thursday afternoon which is a 30 minute break) coffee breaks on Tuesday-Thursday are extended breaks and will run for 60 minutes (coffee points will be open for the first 30 minutes only) from the start time indicated in the programme.
11:00W2.3Session 3 : Reliability in Automotive Applications
11:00W2.3.1Reliability Modeling for Automotive Semiconductors
Göran Jerke, Bosch, DE

11:20W2.3.2Embedded Tutorial : Using RIIF to Model a Complex Automotive System
Viacheslav Izosimov, Semcon, SE

11:40W2.3.3Robustness Metrics for Automotive Power Microelectronics
Thomas Nirmaier, Infineon, DE

12:00W2Lunch Break

Buffet meal
13:00W2.4Session 4 : Modeling and Dependability
13:00W2.4.1From Component Reliability to System Dependability: A Modeling and Assessment Perspective
Jean Arlat, LAAS/CNRS, FR

13:25W2.5Session 5 : Panel Discussion
Panelists:
Authors:
David Appello1, Jean Arlat2, Michael Müller3, Michael Nicolaidis4, Göran Jerke5 and Ulf Schlichtmann6
1ST, FR; 2LAAS/CNRS, FR; 3IBM, DE; 4TIMA Laboratory, FR; 5Bosch, DE; 6Technische Universität München, DE
14:25W2.6Session 6 : Poster Session / Coffee Break

Monday and Friday morning and afternoon coffee breaks will be located in the Salle de Reception. On Tuesday-Thursday the breaks will be located in the Exhibition Hall. Morning and afternoon (with the exception of Thursday afternoon which is a 30 minute break) coffee breaks on Tuesday-Thursday are extended breaks and will run for 60 minutes (coffee points will be open for the first 30 minutes only) from the start time indicated in the programme.
14:45W2.7Session 7 : Reliability Analysis and Optimization
14:45W2.7.1Towards Near Zero Cost of Fault Tolerance for Reliable Low Power Designs
Saquib Khursheed, University of Southampton, UK

15:05W2.7.2System-Level Reliability Modeling for MPSoCs
Thidapat Chantem, Utah State University, US

15:20W2.8Session 8 : Next Steps for RIIF
15:20W2.8.1IEEE Standardization, Case Studies, Working Protocols

15:50W2.9Closing Remarks

Moderator:
Oliver Bringmann, FZI / University of Tuebingen, DE

Further information is available at the workshop website.

Groups: