D2 Hardware Security and Trust
Agenda
Agenda
| Time | Label | Session |
|---|---|---|
| 13:00 | D2 | Lunch Break Buffet meal |
| 14:30 | D2.1 | Session 1 |
| 15:00 | D2.1.2 | Malicious modifications (hardware trojans) to designs and counterfeit ICs Yiorgos Makris, University of Texas at Dallas, US |
| 14:30 | D2.1.1 | Introduction, motivation, hardware security primitives Ramesh Karri, Polytechnic Institute of New York University, US |
| 16:00 | D2 | Coffee Break Monday and Friday morning and afternoon coffee breaks will be located in the Salle de Reception. On Tuesday-Thursday the breaks will be located in the Exhibition Hall. Morning and afternoon (with the exception of Thursday afternoon which is a 30 minute break) coffee breaks on Tuesday-Thursday are extended breaks and will run for 60 minutes (coffee points will be open for the first 30 minutes only) from the start time indicated in the programme. |
| 16:30 | D2.2 | Session 2 |
| 16:30 | D2.2.1 | IC reverse engineering, overbuilding and IP piracy Ozgur Sinanoglu, New York University Abu Dhabi, AE |
| 17:30 | D2.2.2 | Design for Test vulnerabilities and countermeasures Ramesh Karri, Polytechnic Institute of New York University, US |
Speaker bios:
Ramesh Karri (Member, IEEE) received the BE in Electronics and Communications Engineering from Andhra University in 1985, MS in Computer Science from University of Hyderabad in 1988, MS in Computer Engineering and Ph.D. degree in computer science from the University of California San Diego, La Jolla in 1992 and 1993 respectively. He is a Professor in the Electrical and Computer Engineering Department, Polytechnic Institute of New York University. His research interests include trustworthy hardware design and the interaction between security and reliability. He has published over a hundred conference and journal articles in these areas. He has received the NSF CAREER Award and the Alexander Humboldt Fellowship. He is serving as the program chair of the 2012 IEEE Symposium on Hardware oriented Security and Trust (HOST 2012). He is an Associate Editor of the IEEE Transactions on Information Forensics and Security and the ACM Journal of Emerging Technologies in Computing Systems. He has served or is currently serving on several conference program committees.
Yiorgos Makris is an associate professor in the department of Electrical Engineering at UT Dallas. Prior to that he was at Yale University. He received a Ph.D. (2001) and an M.S. (1997) in Computer Engineering from the University of California, San Diego, and a Diploma of Engineering (1995) in Computer Engineering and Informatics from the University of Patras, Greece. His main research interests lie in the application of machine learning and statistical analysis towards developing reliable and trusted integrated circuits, with particular emphasis in the analog/RF domain. He is also investigating error detection and correction methods for modern microprocessors, as well as novel computational modalities using emerging technologies. His research activities have been supported by NSF, SRC, DARPA, Boeing, IBM, LSI, Intel, and TI. He is the program chair of the 2013 VLSI Test Symposium and has served as a guest editor for the IEEE Transactions on Computers and as a committee member for several IEEE and ACM conferences. He is a Senior Member of the IEEE and a recipient of the 2006 Sheffield Distinguished Teaching Award.
Ozgur Sinanoglu is a Faculty of Engineering at New York University in Abu Dhabi. Prof. Ozgur Sinanoglu obtained his Ph.D. in Computer Science and Engineering from University of California, San Diego, in 2004. During his PhD, he was given the IBM PhD Fellowship Award in two consecutive years in 2001 and 2002, and his PhD thesis won the CSE PhD Dissertation Award in UCSD in 2005. He worked for two years at Qualcomm in San Diego as a senior Design-for-Testability engineer, primarily responsible for developing cost-effective test solutions for low-power SOCs. After a 4-year academic experience at Kuwait University, where he was given two research awards, he has joined in Fall 2010 New York University in Abu Dhabi. Upon spending his integration year as a visiting Faculty in New York at the ECE Department of NYU Poly, he joined the Faculty in Abu Dhabi in Fall 2011. His primary field of research is the reliability and trust of integrated circuits, mostly focusing on design-for-testability. He has around 100 conference and journal papers in addition to 3 issued and several pending patents. He is the recipient of the Best Paper Award of VLSI Test Symposium 2011.
