5.6 Advances in Mixed-Signal, RF, and MEMS testing

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Date: Wednesday 20 March 2013
Time: 08:30 - 10:00
Location / Room: Bayard

Chair:
Salvador Mir, TIMA Laboratory, FR

Co-Chair:
Gildás Leger, University of Seville, ES

The first paper uses industrial data to demonstrate a technique for reducing the complexity of wafer-level testing of RF transceivers. The second paper presents the experimental validation of a defect detection and error-recovery technique for microfluidic bio-chips. The third paper shows defect-oriented testing in action for a large industrial mixed-signal circuit.

TimeLabelPresentation Title
Authors
08:305.6.1(Best Paper Award Candidate)
HANDLING DISCONTINUOUS EFFECTS IN MODELING SPATIAL CORRELATION OF WAFER-LEVEL ANALOG/RF TESTS
Authors:
Ke Huang1, Nathan Kupp2, John Carulli3 and Yiorgos Makris1
1UT Dallas, US; 2Yale University, US; 3Texas Instruments, US
Abstract
09:005.6.2FAULT DETECTION, REAL-TIME ERROR RECOVERY, AND EXPERIMENTAL DEMONSTRATION FOR DIGITAL MICROFLUIDIC BIOCHIPS
Authors:
Kai Hu, Bang-Ning Hsu, Andrew Madison, Krishnendu Chakrabarty and Richard Fair, Duke University, US
Abstract
09:305.6.3FAULT ANALYSIS AND SIMULATION OF LARGE SCALE INDUSTRIAL MIXED-SIGNAL CIRCUITS
Authors:
Ender Yilmaz1, Geoff Shofner1, LeRoy Winemberg1 and Sule Ozev2
1Freescale, US; 2Arizona State University, US
Abstract
10:00IP2-11, 682ELECTRICAL CALIBRATION OF SPRING-MASS MEMS CAPACITIVE ACCELEROMETERS
Authors:
Lingfei Deng1, Vinay Kundur1, Naveen Sai Jangala Naga1, Muhlis Kenan Ozel1, Ender Yilmaz1, Sule Ozev1, Bertan Bakkaloglu1, Sayfe Kiaei1, Divya Pratab2 and Tehmoor Dar2
1Arizona State University, US; 2Freescale, US
Abstract
10:00End of session
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