Date: Tuesday 19 March 2013
Time: 11:30 - 13:00
Location / Room: Bayard
Organisers:
Said Hamdioui, Delft University of Technology, NL
Dimitris Gizopoulos, University of Athens, GR
Chair:
Said Hamdioui, Delft University of Technology, NL
Co-Chair:
Dimitris Gizopoulos, University of Athens, GR
Three leading researchers in various layers of system design and integration (technology, circuit, system, application) will present recent innovations in addressing emerging questions about reliability of the electronics of today's and tomorrow's real-time systems. Speakers will address the challenges from technology perspective, from circuit/IP perspective and from architectural and hardware/software integration perspective.
| Time | Label | Presentation Title Authors |
|---|---|---|
| 11:30 | 2.6.1 | CHALLENGES IN ASSESSING AND ASSURING RELIABILITY OF NANO-SCALED CMOS TECHNOLOGIES Author: Guido Groeseneken, IMEC, BE Abstract |
| 12:00 | 2.6.2 | ADDA: ADAPTIVE DOUBLE-SAMPLING ARCHITECTURE FOR HIGHLY FLEXIBLE ROBUST DESIGN Author: Michael Nicolaidis, TIMA, FR Abstract |
| 12:30 | 2.6.3 | RELIABILITY CHALLENGES IN THE DESIGN OF CRITICAL EMBEDDED SYSTEMS Authors: Arnaud Grasset and Philippe Bonnot, Thales, FR Abstract |
| 13:00 | End of session Lunch Break in Auditorium Dauphine (Lunch and Learn Session) and Ecrins Sandwich lunch in both locations (Lunch and Learn Session Sponsored by Mentor Graphics: "Grenoble Ecosystem to Provide Semiconductor Alternative Process for Advanced CMOS - 1300-1400 hrs; http://www.date-conference.com/conference/session/3.0) |