BASTION: Board and SoC Test Instrumentation for Ageing and No Failure Found
Artur Jutman1, Christophe Lotz2, Erik Larsson3, Matteo Sonza Reorda4, Maksim Jenihhin5,a, Jaan Raik5,b, Hans Kerkhoff6, Rene Krenz-Baath7 and Piet Engelke8
1Testonica, Estonia.
artur@testonica.com
2Aster Technologies, France.
christophe.lotz@aster-technologies.com
3University of Lund, Sweden.
erik.larsson@eit.lth.se
4Politecnico Di Torino, Italy.
matteo.sonzareorda@polito.it
5Tallinn Technical University, Estonia.
amaksim@pld.ttu.ee
bjaan@pld.ttu.ee
6University of Twente, The Netherlands.
h.g.kerkhoff@utwente.nl
7Hochschule Hamm-Lippstadt, Germany.
Rene.Krenz-Baath@hshl.de
8Infineon Technologies AG, Germany.
Piet.Engelke@infineon.com
ABSTRACT
This is an overview paper that motivates and describes performed work done in the European Commission funded research project BASTION, which focuses on two critical problems of modern electronics: the No-Fault-Found (NFF) and CMOS ageing. New defect classes contributing to NFF have been identified, including timing related faults (TRF) at board level and intermittent resistive faults (IRF) at IC level. BASTION has addressed the mechanisms of ageing and developed several techniques to improve the longevity of electronic products. Embedded Instrumentation, monitors, and IEEE 1687 standard for reconfigurable scan networks (RSN) are seen as an important leverage that helped mitigating the impact of the above listed problems by facilitating a low-latency, scalable online system health monitoring and error localization infrastructure as well as integration of all heterogeneous technologies into a homogeneous demonstration platform. This paper helps the reader to get a general overview of the work performed and provides a collection of references to publications where the respective research results are described in detail.
Keywords: No-Fault-Found, No-Trouble-Found, Aging, Embedded instruments, IEEE 1687, IJTAG.
