Topic: T4 System-Level Reliability Design, Analysis and On-line Test

Fault models: Permanent, Transient and Soft Errors; Dependability Evaluation; Space-, Time- and Information-redundancy based dependability solutions; Highly-Available Systems; Reliable, Secure and Fail-Safe System Design; HW/SW solutions for on-line fault detection, tolerance, recovery and aging mitigation; Countermeasures Against Fault Attacks.

Chair: Cristiana Bolchini, Politecnico di Milano, IT, Contact

Co-Chair: Jaume Abella, Barcelona Supercomputing Center, ES, Contact

Members:

• Lorena Anghel, TIMA Laboratory, FR, Contact
• Jie Han, University of Alberta, CA, Contact
• Viacheslav Izosimov, The Royal Institute of Technology (KTH), SE, Contact
• Maksim Jenihhin, Tallinn University of Technology, EE, Contact
• Cecilia Metra, University of Bologna, IT, Contact
• Brett Meyer, McGill University, CA, Contact
• Maria Michael, University of Cyprus, CY, Contact
• , Contact
• Mihalis Psarakis, , GR, Contact
• Pedro Reviriego, Universidad Antonio de Nebrija, ES, Contact
• Ioannis Sourdis, Chalmers Univeristy of Technology, SE, Contact
• Andreas Steininger, Vienna University of Technology, AT, Contact