Date: Thursday 21 March 2013
Time: 16:00 - 17:30
Location / Room: Belle-Etoile

Chair:
Luciano Lavagno, Politecnico di Torino, IT

Co-Chair:
Jürgen Teich, University of Erlangen-Nuremberg, DE

The first paper in the session discusses how to selectively duplicate hardware in order to optimize yield in a binning scenario. The second paper also uses duplication and re-execution to optimize software reliability by taking error masking into account. Finally the third paper considers variable levels of security and intrusion detection, while satisfying tight performance constraints both at design and at run-time.

Time	Label	Presentation Title Authors
16:00	12.2.1	(Best Paper Award Candidate) A NEW PARADIGM FOR TRADING OFF YIELD, AREA AND PERFORMANCE TO ENHANCE PERFORMANCE PER WAFER Authors: Yue Gao, Melvin Breuer and Yanzhi Wang, University of Southern California, US Abstract
16:30	12.2.2	LEVERAGING VARIABLE FUNCTION RESILIENCE FOR SELECTIVE SOFTWARE RELIABILITY ON UNRELIABLE HARDWARE Authors: Semeen Rehman, Muhammad Shafique, Pau Vilimelis Aceituno, Florian Kriebel, Jian-Jia Chen and Jörg Henkel, Karlsruhe Institute of Technology, DE Abstract
17:00	12.2.3	OPTIMIZATION OF SECURE EMBEDDED SYSTEMS WITH DYNAMIC TASK SETS Authors: Ke Jiang, Petru Eles and Zebo Peng, Linköping University, SE Abstract
17:30		End of session