EM SCA & FI Self-Awareness and Resilience with Single On-chip Loop & ML Classifiers
Archisman Ghosh1, Debayan Das1, Santosh Ghosh2 and Shreyas Sen1
1School of Electrical and Computer Engineering, Purdue University, West Lafayette, IN, USA
2Intel Labs, Intel Corporation, Hillsboro, OR. USA
ABSTRACT
Securing ICs are becoming increasingly challenging with rapid improvements in electromagnetic (EM) side-channel analysis (SCA) and fault injection (FI) attacks. In this work, we develop a pro-active approach to detect and counter these attacks by embedding a single on-chip integrated loop around a crypto core (AES-256), designed and fabricated using TSMC 65nm process. The measured results demonstrate that the proposed system 1) provides EM-Self-awareness by acting as an on-chip H-field sensor, detecting voltage/clock glitching fault-attacks; 2) senses an approaching EM probe to detect any incoming threat; and 3) can be used to induce EM noise to increase resilience against EM attacks. This work combines EM analysis, ML based secured system and shows the efficacy by measurements from custom-built 65nm CMOS IC.
Keywords: On-chip Sensor, Fault Injection Detection, Approaching EM Probe detection, Inductive sensing, EM sidechannel, Clock and Voltage glitch detection, Machine Learning Classification, Attack Resilience.
