RESCUE: Interdependent Challenges of Reliability, Security and Quality in Nanoelectronic Systems
M. Jenihhin1,a, S. Hamdioui2, M. Sonza Reorda3, M. Krstic4, P. Langendörfer4, C. Sauer5, A. Klotz5, M. Huebner6, J. Nolte6, H. T.Vierhaus6, G. Selimis7, D. Alexandrescu8, M. Taouil2, G. J. Schrijen7, J. Raik1, L. Sterpone3, G. Squillero3 and Z. Dyka4
1Tallinn University of Technology, Estonia
2Delft University of Technology, The Netherlands
3Politecnico di Torino, Italy;
4IHP – Leibniz-Institut für innovative Mikroelektronik Germany
5Cadence Design Systems GmbH, Germany
6BTU Cottbus-Senftenberg, Germany
7Intrinsic ID B.V., The Netherlands
8IROC Technologies, France
amaksim.jenihhin@taltech.ee
ABSTRACT
The recent trends for nanoelectronic computing systems include machine-to-machine communication in the era of Internet-of-Things (IoT) and autonomous systems, complex safety-critical applications, extreme miniaturization of implementation technologies and intensive interaction with the physical world. These set tough requirements on mutually dependent extra-functional design aspects. The H2020 MSCA ITN project RESCUE is focused on key challenges for reliability, security and quality, as well as related electronic design automation tools and methodologies. The objectives include both research advancements and cross-sectoral training of a new generation of interdisciplinary researchers. Notable interdisciplinary collaborative research results for the first halfperiod include novel approaches for test generation, soft-error and transient faults vulnerability analysis, cross-layer fault-tolerance and error-resilience, functional safety validation, reliability assessment and run-time management, HW security enhancement and initial implementation of these into holistic EDA tools.
Keywords: Reliability, Security, Test, Fault Tolerance, EDA Tools.
