doi: 10.3850/978-3-9815370-4-8_0771

ABSTRACT

Online defect screening techniques to detect runtime faults are becoming a necessity in current and near future technologies. At the same time, due to aggressive technology scaling into the nanometer regime, power consumption is becoming a significant burden. Most of today's chips employ advanced power management features to monitor the power consumption and apply dynamic power budgeting (i.e., capping) accordingly to prevent over-heating of the chip. Given the notable power dissipation of existing testing methods, one needs to efficiently manage the power budget to cover test process of a many-core system in runtime. In this paper, we propose a power-aware online testing method for many-core systems benefiting from advanced power management capabilities. The proposed poweraware method uses non-intrusive online test scheduling strategy to functionally test the cores in their idle period. In addition, we propose a test-aware utilization-oriented runtime mapping technique that considers the utilization of cores and their test criticality in the mapping process. Our extensive experimental results reveal that the proposed power-aware online testing approach can efficiently utilize temporarily free resources and available power budget for the testing purposes, within less than 1% penalty on system throughput for the 16nm technology.

Keywords: Online testing, Functional testing, Dark silicon, Power capping, Many-core systems.

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