An Extension of Cohn's Sensitivity Theorem to Mismatch Analysis of 1-Port Resistor Networks

Sébastien Cliquennois
ST Microelectronics, 12, rue Jules Horowitz, 38017 GRENOBLE Cedex - France.


An analytical expression of statistical mismatch properties of 1-port resistor networks and associated figure-ofmerit is proposed, and related to Cohn's sensitivity theorem. This expression is then used to demonstrate matching properties of R-ladders. Experimental verification of this formula is done by comparing theoretical results to Monte-Carlo simulations of random R-networks up to 10 resistors, which are generated by a new graph-based algorithm. Further analysis is performed on this figure-of-merit for all generated networks, leading to more insights into matching properties of R-networks.

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