Date: Thursday 21 March 2013
Time: 14:00 - 15:30
Location / Room: Chartreuse
Chair:
Frank Oppenheimer, OFFIS, DE
Co-Chair:
François Pêcheux, UPMC, FR
Physical properties have a great impact on the robustness and predictable behaviour of complex micro-electronic systems, and therefore should be considered at system-level. The first paper addresses power and thermal management at the transaction level, while the last two papers present innovative analysis techniques to increase system reliability.
| Time | Label | Presentation Title Authors |
|---|---|---|
| 14:00 | 11.4.1 | SYSTEM-LEVEL MODELING OF ENERGY IN TLM FOR EARLY VALIDATION OF POWER AND THERMAL MANAGEMENT Authors: Tayeb Bouhadiba1, Matthieu Moy2 and Florence Maraninchi2 1Verimag/CNRS, FR; 2Verimag/Grenoble INP, FR Abstract |
| 14:30 | 11.4.2 | SYSTEM-LEVEL MODELING AND MICROPROCESSOR RELIABILITY ANALYSIS FOR BACKEND WEAROUT MECHANISMS Authors: Chang-Chih Chen and Linda Milor, Georgia Institute of Technology, US Abstract |
| 15:00 | 11.4.3 | AUTOMATIC SUCCESS TREE-BASED RELIABILITY ANALYSIS FOR THE CONSIDERATION OF TRANSIENT AND PERMANENT FAULTS Authors: Hananeh Aliee, Michael Glaß, Felix Reimann and Jürgen Teich, University of Erlangen-Nuremberg, DE Abstract |
| 15:30 | IP5-16, 574 | HYBRID PROTOTYPING OF MULTICORE EMBEDDED SYSTEMS Authors: Ehsan Saboori and Samar Abdi, Concordia University, CA Abstract |
| 15:30 | End of session Coffee Break in Exhibition Hall Monday and Friday morning and afternoon coffee breaks will be located in the Salle de Reception. On Tuesday-Thursday the breaks will be located in the Exhibition Hall. Morning and afternoon (with the exception of Thursday afternoon which is a 30 minute break) coffee breaks on Tuesday-Thursday are extended breaks and will run for 60 minutes (coffee points will be open for the first 30 minutes only) from the start time indicated in the programme. |