Testing at various levels of a system: embedded core, System-on-Chip, System-in-Package, board, system; testing 3D (TSV-based) chips; Network-on-Chip test; system-level debug and validation; hardware/software system test; processor-based test; infrastructure IP; industrial test: test equipment, including ATE hardware and software, probe stations, handlers; multi-site testing; economics of test; case studies.