Fine-Grained Hardware Mitigation for Multiple Long-Duration Transients on VLIW Function Units
Rafail Psiakisa, Angeliki Kritikakoub and Olivier Sentieysc
University of Rennes 1 - IRISA/INRIA, Rennes, France
arafail.psiakis@inria.fr
bangeliki.kritikakou@inria.fr
colivier.sentieys@inria.fr
ABSTRACT
Technology scaling makes hardware more susceptible to radiation, which can cause multiple transient faults with long duration. In these cases, the affected function unit is usually considered as faulty and is not further used. To reduce this performance degradation, the proposed hardware mechanism detects the faults that are still active during execution and reschedules the instructions to use the fault-free components of the affected function units. The results show multiple long-duration fault mitigation with low performance, area, and power overhead.
