doi: 10.7873/DATE.2015.0744

Temperature-Aware Software-Based Self-Testing for Delay Faults

Ying Zhang1,a, Zebo Peng2, Jianhui Jiang1,b, Huawei Li3 and Masahiro Fujita4

1School of Software Engineering, Tongji University, China.

2Embedded Systems Lab, Linköping University, Sweden.

3State Key Laboratory of Computer Architecture, Institute of Computing Technology, Chinese Academy of Sciences, China.

4VLSI Design and Education Center, University of Tokyo, Japan.


Delay defects under high temperature have been one of the most critical factors to affect the reliability of computer systems, and the current test methods don’t address this problem properly. In this paper, a temperature-aware software-based selftesting (SBST) technique is proposed to self-heat the processors within a high temperature range and effectively test delay faults under high temperature. First, it automatically generates highquality test programs through automatic test instruction generation (ATIG), and avoids over-testing caused by nonfunctional patterns. Second, it exploits two effective powerintensive program transformations to self-heat up the processors internally. Third, it applies a greedy algorithm to search the optimized schedule of the test templates in order to generate the test program while making sure that the temperature of the processor under test is within the specified range. Experimental results show that the generated program is successful to guarantee delay test within the given temperature range, and achieves high test performance with functional patterns.

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