Temperature-Aware Software-Based Self-Testing for Delay Faults
Ying Zhang1,a, Zebo Peng2, Jianhui Jiang1,b, Huawei Li3 and Masahiro Fujita4
1School of Software Engineering, Tongji University, China.
2Embedded Systems Lab, Linköping University, Sweden.
3State Key Laboratory of Computer Architecture, Institute of Computing Technology, Chinese Academy of Sciences, China.
4VLSI Design and Education Center, University of Tokyo, Japan.
Delay defects under high temperature have been one of
the most critical factors to affect the reliability of computer
systems, and the current test methods don’t address this problem
properly. In this paper, a temperature-aware software-based selftesting
(SBST) technique is proposed to self-heat the processors
within a high temperature range and effectively test delay faults
under high temperature. First, it automatically generates highquality
test programs through automatic test instruction
generation (ATIG), and avoids over-testing caused by
nonfunctional patterns. Second, it exploits two effective powerintensive
program transformations to self-heat up the processors
internally. Third, it applies a greedy algorithm to search the
optimized schedule of the test templates in order to generate the
test program while making sure that the temperature of the
processor under test is within the specified range. Experimental
results show that the generated program is successful to
guarantee delay test within the given temperature range, and
achieves high test performance with functional patterns.
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