Published on DATE 2011 (https://past.date-conference.com/date11)

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T2 Test Generation, Simulation and Diagnosis

Test pattern generation; high-level TPG; delay TPG; fault simulation; test generation for validation, debug and diagnosis; low-power TPG; TPG for memories and FPGAs.
 

Source URL: https://past.date-conference.com/date11/chairs/t2