4.3 EMBEDDED TUTORIAL: Reliability Analysis Reloaded: How Will We Survive?

Date: Tuesday 19 March 2013
Time: 17:00 - 18:30
Location / Room: Stendahl

Organisers:
Matteo Sonza Reorda, Politecnico di Torino, IT
Goerschwin Fey, University of Bremen, DE

Chair:
Bernd Becker, University of Freiburg, DE

Co-Chair:
Xavier Vera, Intel, ES

Concepts for reliability analysis have been a hot topic in research and industry ever since the introduction of electronic systems over 40 years ago. Reliability problems are expected to increase rapidly for future technology nodes, for many reasons. The sheer complexity of today's and future "more Moore" and "more than Moore" systems as well as the huge universe of potential faults requires reliability analysis to be revisited from this new perspective. This embedded tutorial will focus on reliability analysis from both an academic and an industrial perspective, including different layers of abstraction. The first talk will concentrate on the lowest layer from an industrial perspective, i.e. how we can find models for device-level reliability that may be used for determining the reliability of a system. The second talk will approach state-of-the-art techniques from an academic point of view to evaluate the reliability of complex systems, including virtualization environments. The tutorial will be completed with a talk that describes the development of safety critical systems in industrial automation, in particular pointing out how reliability evaluation is handled on the basis of current safety standards.